The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Mar. 03, 2011
Applicants:

Takehiko Oonuma, Oyama, JP;

Tomohiro Sugimura, Otawara, JP;

Inventors:

Takehiko Oonuma, Oyama, JP;

Tomohiro Sugimura, Otawara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/10 (2013.01); G01N 35/1004 (2013.01); G01N 2035/1025 (2013.01); G01N 35/1011 (2013.01);
Abstract

An automated analyzer according to an embodiment includes a probe. The probe has a step part configured to be provided between a lower shaft and an upper shaft, and to be formed such that the outer diameter changes. A descending controller lowers the probe from a predefined position that positions the step part above the liquid surface to an operating position that positions the step part below the liquid surface. A ascending controller raises the probe at a high speed from the operating position until immediately before the step part reaches the position of the liquid surface, subsequently raises the probe at a low speed until the step part passes through the liquid surface, and raises the probe at a higher speed than the low speed from immediately after the step part passes through the position of the liquid surface up to the predefined position.


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