The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jul. 19, 2007
Applicants:

Atsushi Naito, Aichi, JP;

Naoki Kaneko, Toyokawa, JP;

Akihiko Matsumoto, Toyokawa, JP;

Kanji Sekihara, Toyokawa, JP;

Shinichiro Hara, Toyokawa, JP;

Inventors:

Atsushi Naito, Aichi, JP;

Naoki Kaneko, Toyokawa, JP;

Akihiko Matsumoto, Toyokawa, JP;

Kanji Sekihara, Toyokawa, JP;

Shinichiro Hara, Toyokawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A die having a plurality of cavities and a temperature sensor for acquiring a temperature value in which the number of the cavities is larger than that of electrothermal conversion elements. When viewed from a direction perpendicular to the surface of a parting line, all cavities and a temperature sensor are arranged in a region occupied by the electrothermal conversion elements. Interval between the outlines of the cavities is smaller than the minimum interval between the outline of the cavity and the electrothermal conversion element, and the shortest distance between the electrothermal conversion element and the temperature measuring portion of a temperature measuring element is shorter than the minimum interval between the outline of the cavity and the electrothermal conversion element.


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