The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Nov. 21, 2008
Applicant:
Michael Brownell, San Clemente, CA (US);
Inventor:
Michael Brownell, San Clemente, CA (US);
Assignee:
AMO Development LLC, Santa Ana, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/18 (2006.01); A61B 3/10 (2006.01); A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1005 (2013.01); A61F 2009/00872 (2013.01); A61F 9/008 (2013.01); A61F 2009/00897 (2013.01);
Abstract
Systems, apparatus, and methods are disclosed for locating tissue layer transitions within a cornea, including focusing a laser to a laser spot with an energy below a photodisruption threshold of the cornea, varying a position of the focal spot of the laser between an anterior surface of the cornea and a posterior surface of the cornea, and determining one or more transitions of the tissue layers based on a change in harmonic light generated by the laser spot.
Brownell, Michael. (2014). Apparatus, system and method for precision depth measurement (U.S. Patent No. 8852175). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8852175
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile