The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

May. 27, 2010
Applicant:

Michael Pasternak, Raanana, IL;

Inventor:

Michael Pasternak, Raanana, IL;

Assignee:

Red Hat Israel, Ltd., Raanana, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

A mechanism for performing dynamic software testing on a computer system based on grouping of tests using a test list entity. A method of embodiments of the invention includes causing execution a first group of first tests based on a first set of configuration settings, and executing the first group includes enabling a test execution script to run the first tests according to the first set of configuration settings, and the test execution script is hosted at a test execution platform of a computer system. The method further includes facilitating creation, in runtime, a second group of second tests based on a second set of configuration settings that is different from the first set of configuration settings, and causing execution, in runtime, the second group of second tests, and executing the second group includes enabling the test execution script to run the second tests according to the second set of configuration settings.


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