The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Nov. 23, 2011
Stephan Froehlich, Aschheim, DE;
Jan Schormann, München, DE;
Joern Simon, Feldkirchen, DE;
Valentin Elefteriu, Kirchheim, DE;
Alexander Urban, Forstinning, DE;
Stephan Froehlich, Aschheim, DE;
Jan Schormann, München, DE;
Joern Simon, Feldkirchen, DE;
Valentin Elefteriu, Kirchheim, DE;
Alexander Urban, Forstinning, DE;
Brainlab AG, Feldkirchen, DE;
Abstract
The present invention relates to a method of determining an analyzing level for analyzing a system test procedure for testing a modular system having functional modules, comprising acquiring dependency data comprising dependency information describing at least one functional dependency of at least one functional module, acquiring change data comprising change information describing a change in a module test procedure for testing at least part of the at least one functional module located at a first system test level, acquiring impact data comprising impact information describing an impact of the change in the module test procedure on testing a functionality of the at least one functional module based on the dependency information and the change information, determining, based on the impact information, analyzing level data comprising analyzing level information describing an analyzing level being the system test level at which the system test procedure is analyzed.