The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Mar. 30, 2012
Le He, Beijing, CN;
Zhong J. LI, Beijing, CN;
Yong G. Pan, Beijing, CN;
Chunhua Tian, Beijing, CN;
Rui Xiong Tian, Beijing, CN;
Qing BO Wang, Beijing, CN;
Jun Zhu, Beijing, CN;
Le He, Beijing, CN;
Zhong J. Li, Beijing, CN;
Yong G. Pan, Beijing, CN;
Chunhua Tian, Beijing, CN;
Rui Xiong Tian, Beijing, CN;
Qing Bo Wang, Beijing, CN;
Jun Zhu, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention discloses a method and system for processing test cases for applications to be tested. The method includes evaluating two applications to be tested; obtaining test cases for the two applications to be tested and determining resources and execution times needed by the test cases for the two applications to be tested. According to the compatibility relationship between the two applications to be tested, and the resources and execution times needed by the test cases for the two applications to be tested, the test cases for the two applications to be tested are clustered to a virtual machine instance to test the test cases for the two applications to be tested on the virtual machine instance.