The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Nov. 15, 2010
Aaron Dietrich, Bothell, WA (US);
Sylvain Goyette, Laval, CA;
Van Stephen Lanning, Bellevue, WA (US);
Aaron Dietrich, Bothell, WA (US);
Sylvain Goyette, Laval, CA;
Van Stephen Lanning, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Techniques for conducting an automated analysis of operations carried out during the critical path for a usage scenario and suggesting ways in which the configuration of the computing device could be changed to affect performance of the computing device. Computing devices can be operated in a variety of usage scenarios and users may notice the performance of a computing device in certain usage scenarios more particularly. Critical path analysis of operations conducted in these usage scenarios can be used to identify a critical path of the usage scenario, from which changes that could be made to the computing device to affect performance could be identified. Once the changes that could be made are identified, suggestions can be made to the user, such that a user is able to make changes to the configuration to affect performance when the user has little knowledge about how to improve configurations.