The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

May. 13, 2011
Applicants:

Rajiv V. Joshi, Yorktown Heights, NY (US);

Rouwaida N. Kanj, Round Rock, TX (US);

Keunwoo Kim, Somers, NY (US);

Tong LI, Pine Brook, NJ (US);

Inventors:

Rajiv V. Joshi, Yorktown Heights, NY (US);

Rouwaida N. Kanj, Round Rock, TX (US);

Keunwoo Kim, Somers, NY (US);

Tong Li, Pine Brook, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5022 (2013.01); G06F 17/5036 (2013.01);
Abstract

In one embodiment, the invention is a method and apparatus for table-lookup-based models for yield analysis acceleration. One embodiment of a method for statistically evaluating a design of an integrated circuit includes simulating the integrated circuit and generating a lookup table for use in the simulating, the lookup table comprising one or more blocks that specify a device element for an associated bias voltage, wherein the generating comprises generating only those of the one or more blocks that specify the device element for a bias voltage that is required during the simulating.


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