The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Jun. 26, 2008
Yasuo Amemiya, Hartsdale, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Walter Hirt, Wettswil, CH;
Ying Hung, Atlanta, GA (US);
Jing Shen, Athens, GA (US);
Yasuo Amemiya, Hartsdale, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Walter Hirt, Wettswil, CH;
Ying Hung, Atlanta, GA (US);
Jing Shen, Athens, GA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for monitoring and predicting environmental operating conditions in a data center are provided. In one aspect, a method for real-time, three-dimensional analysis of environmental operating conditions in a data center includes the following steps. High spatial resolution three-dimensional measurements of one or more environmental variables in the data center made at a time tare obtained. Real-time measurements of the environmental variables in the data center made at a time t, wherein tis later in time than t, are obtained. The high spatial resolution three-dimensional measurements are combined with the real-time measurements to derive a model for the environmental variables in the data center at the time t. The model is used to predict three-dimensional distributions of the environmental variables in the data center at the time t. A base model can be created and used to derive the model for the data center at the time t.