The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Dec. 30, 2009
Applicants:

Arman Melkumyan, Lane Cove, AU;

Fabio Tozeto Ramos, Alexandria, AU;

Inventors:

Arman Melkumyan, Lane Cove, AU;

Fabio Tozeto Ramos, Alexandria, AU;

Assignee:

The University of Sydney, The University of Sydney, New South Wales, AU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 7/60 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01);
Abstract

A system for large scale data modelling is described. The system includes at least one data measurement sensor () for generating measured data, a training processor () to determine optimized hyperparameter values in relation to a Gaussian process covariance function including a sparse covariance function that is smooth and diminishes to zero outside of a characteristic hyperparameter length. An evaluation processor () determines model data from the Gaussian process covariance function with optimised hyperparameter values and measured data. Also described is methods for modelling date, including a method using a Gaussian process including a sparse covariance function that diminishes to zero outside of a characteristic length, wherein the characteristic length is determined from the data to be modelled.


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