The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jul. 30, 2010
Applicants:

Swati Mehta, San Jose, CA (US);

Cyrus Bamji, Fremont, CA (US);

Inventors:

Swati Mehta, San Jose, CA (US);

Cyrus Bamji, Fremont, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01); G01S 17/36 (2006.01); G01S 7/493 (2006.01); G01S 7/491 (2006.01); H04N 17/00 (2006.01); H04N 5/357 (2011.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); H04N 17/002 (2013.01); G01S 7/493 (2013.01); H04N 5/357 (2013.01); G01S 7/4915 (2013.01);
Abstract

An analytical tool useable with complex systems receives as input various system parameters to predict whether sufficiently accurate quality depth data will be provided by the TOF system. Depth data quality estimates involve dividing system operation into smaller operations whose individual depth data quality contributions can be more readily computed. The effect of the individual operations is combined and the tool outputs a depth data quality estimate accounting for the net result of the various unique operations performed by the system. When used with a TOF system, input parameters may include magnitude and angular distribution of TOF emitted optical energy, desired signal/noise, sensor characteristics, TOF imaging optics, target object distances and locations, and magnitude of ambient light. Analytical tool output data can ensure adequate calculation accuracy to optimize the TOF system pre-mass production, even for TOF systems whose sequence of operations and sensor operations are flexibly programmable.


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