The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Oct. 27, 2011
Applicants:

Ken A. Nishimura, Fremont, CA (US);

Kenneth Rush, Colorado Springs, CO (US);

Inventors:

Ken A. Nishimura, Fremont, CA (US);

Kenneth Rush, Colorado Springs, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0272 (2013.01);
Abstract

A method of calibrating a reconstructed signal from a plurality of sub-signals is provided. The method includes injecting a calibration signal having multiple tones into a received input signal; dividing the input signal into a first and second sub-signal, including an overlapping frequency band; performing a first frequency translation by converting frequency components of the second sub-signal; digitizing the first sub-signal and the frequency converted second sub-signal; performing a second frequency translation to reverse the first frequency translation to obtain a reconstructed second sub-signal; and quantifying impairments to the digital first sub-signal and reconstructed second sub-signal caused by differences in magnitude and phase of frequency components within the overlapping frequency band.


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