The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Sep. 28, 2010
Applicants:

Yiping Feng, North Brunswick, NJ (US);

Peter Kinget, Summit, NJ (US);

Inventors:

Yiping Feng, North Brunswick, NJ (US);

Peter Kinget, Summit, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); H04B 17/0062 (2013.01);
Abstract

In accordance with some embodiments, methods for controlling the second order intercept point in a receiver are provided, the methods comprising: generating an amplitude modulated test tone; causing the test tone to be received by a receiver; determining a characteristic of a second order intercept point of the receiver based on the received test tone; and based on the characteristic, adjusting a parameter of the receiver. In accordance with some embodiments, systems for controlling the second order intercept point in a receiver are provided, the systems comprising: a test tone generator that generates an amplitude modulated test tone; a receiver that receives the test tone; a correlator that determines a characteristic of a second order intercept point of the receiver based on the received test tone; and digital logic that, based on the characteristic, adjusts a parameter of the receiver.


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