The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Dec. 29, 2011
Applicant:

Yasuhiro Fukunaga, Tokyo, JP;

Inventor:

Yasuhiro Fukunaga, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01J 3/51 (2006.01); H04N 9/04 (2006.01); H04N 5/353 (2011.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G01J 3/513 (2013.01); H04N 9/045 (2013.01); H04N 5/3537 (2013.01); H04N 5/2353 (2013.01);
Abstract

A method of adjusting an output level of a measurement pixel may include a first step of selecting a type of a target sample from a plurality of previously determined sample type candidates, a second step of measuring an output level of a reference pixel based on light from the target sample incident on the reference pixel, a third step of selecting a level adjustment parameter associated with the type of the target sample selected in the first step, the plurality of candidates being associated with the type of the target sample, a fourth step of calculating a level adjustment amount of the measurement pixel, and a fifth step of adjusting the output level using the level adjustment amount when measuring an output level corresponding to the light from the target sample.


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