The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Mar. 12, 2009
Applicants:

Max Schaule, Mindelheim, DE;

Arnfried Kiermeier, Oberaudorf, DE;

Stefan Binder, Rosenheim, DE;

Inventors:

Max Schaule, Mindelheim, DE;

Arnfried Kiermeier, Oberaudorf, DE;

Stefan Binder, Rosenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); G01M 1/14 (2006.01); G01N 29/00 (2006.01); G01V 13/00 (2006.01); G01M 7/00 (2006.01); H04R 17/00 (2006.01); H04R 19/00 (2006.01);
U.S. Cl.
CPC ...
H04R 29/004 (2013.01); H04R 17/00 (2013.01); H04R 19/005 (2013.01);
Abstract

A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.


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