The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Mar. 08, 2013
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspection apparatus obtains a threshold value indicating an allowable range of offset differences between an output target inspection image and a pre-provided inspection image, and determines whether to inspect a read image obtained by reading an output target image formed on a recording sheet having a pre-provided image, using the threshold value.