The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jul. 10, 2008
Applicants:

Wonshik Choi, Somerville, MA (US);

Ramachandra Rao Dasari, Schererville, IN (US);

Christopher M. Fang-yen, Brookline, MA (US);

Michael S. Feld, Jamaica Plain, MA (US);

Inventors:

Wonshik Choi, Somerville, MA (US);

Ramachandra Rao Dasari, Schererville, IN (US);

Christopher M. Fang-Yen, Brookline, MA (US);

Michael S. Feld, Jamaica Plain, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/45 (2006.01); G01N 21/51 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/51 (2013.01); G01N 21/6458 (2013.01);
Abstract

The present invention relates to systems and methods for quantitative three-dimensional mapping of refractive index in living or non-living cells, tissues, or organisms using a phase-shifting laser interferometric microscope with variable illumination angle. A preferred embodiment provides tomographic imaging of cells and multicellular organisms, and time-dependent changes in cell structure and the quantitative characterization of specimen-induced aberrations in high-resolution microscopy with multiple applications in tissue light scattering.


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