The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jun. 27, 2012
Applicants:

Krasimir D. Kolarov, Menlo Park, CA (US);

Steven E. Saunders, Cupertino, CA (US);

Inventors:

Krasimir D. Kolarov, Menlo Park, CA (US);

Steven E. Saunders, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); H04N 7/12 (2006.01); H04N 11/02 (2006.01); H04N 11/04 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

Evaluating coded video by identifying spatial and temporal errors in the reconstructed video. Spatial errors may be identified by evaluating the severity of each individual error and pooling closely located errors to determine whether the collection of errors is noticeable. Temporal errors may be identified by evaluating the quality of each frame and then pooling consecutive frames to determine whether the collection of frames has errors that may be noticeable if the errors persist within the sequence of consecutive frames. The quality of the frames may be analyzed with any conventional analysis metric. In an embodiment, the quality of the frames may be analyzed using a row-column metric. The calculated analysis metrics may be normalized to accurately compare different metric calculations.


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