The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Sep. 21, 2012
Naoto Watanabe, Kanagawa, JP;
Toshiaki Tokita, Kanagawa, JP;
Kohji Sakai, Tokyo, JP;
Nobuaki Kubo, Tokyo, JP;
Naoto Watanabe, Kanagawa, JP;
Toshiaki Tokita, Kanagawa, JP;
Kohji Sakai, Tokyo, JP;
Nobuaki Kubo, Tokyo, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical scanning device scanning scan target surfaces in a first direction with light includes: a light source emitting first and second light beams corresponding to two of the scan target surfaces; an optical deflector including a reflection surface on which the emitted first and second light beams are obliquely incident while being separated from each other in a second direction perpendicular to the first direction, and deflecting the first and second light beams; a scanning lens disposed on respective optical paths of the deflected first and second light beams; and a branching optical element transmitting therethrough most of the first light beam transmitted through the scanning lens, and reflecting most of the second light beam transmitted through the scanning lens. The deflected first and second light beams intersect between the optical deflector and the branching optical element, when projected on a plane perpendicular to the first direction.