The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jul. 16, 2012
Applicants:

Ethan Cannon, Sammamish, WA (US);

Salim Rabaa, Lake Forest Park, WA (US);

Josh Mackler, Seattle, WA (US);

Inventors:

Ethan Cannon, Sammamish, WA (US);

Salim Rabaa, Lake Forest Park, WA (US);

Josh Mackler, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/003 (2006.01); H01L 21/70 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit and methods for mitigating radiation-induced Single Event Effects (SEE) in Silicon-on-Insulator (SOI) Complementary Metal-Oxide-Semiconductor (CMOS) integrated circuits are presented. A primary logic output is generated from a primary logic gate in response to an input. A redundant logic output is generated from a redundant logic gate that duplicates the primary logic output in response to the input if an SEE is not present. An interleaved C-gate output is generated from an interleaved C-gate that emulates an inverter output when the primary logic output and the redundant logic output match, and does not changes its output when the primary logic output and the redundant logic output do not match during the SEE.


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