The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Jul. 02, 2011
Martin Hacker, Jena, DE;
Thomas Pabst, Stadtroda, DE;
Ralf Ebersbach, Schmoelin, DE;
Gerard Antkowiak, Jena, DE;
Martin Hacker, Jena, DE;
Thomas Pabst, Stadtroda, DE;
Ralf Ebersbach, Schmoelin, DE;
Gerard Antkowiak, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
An ophthalmological measuring system for determining distances and/or for tomographic imaging of ocular structures, based on an OCT method. The measuring system includes a light source with a spectral centroid (λ), an interferometric measuring device, a scanner system, which in addition to the lateral deflection of the sample beam also has axial modulations with a frequency (f) in the sample arm, and a control and evaluation unit. The scanner performs a lateral, two-dimensional deflection of the sample beam with the aid of one or even two separate mirror elements and can in particular have axial modulation amplitudes z>>λ/2. The system can also be used for scanner systems in other fields that use an OCT method, in particular a swept-source OCT method.