The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Dec. 05, 2011
Applicants:
Francis Dams, Kessel-Lo, BE;
Lihuan Song, Lommel, BE;
Johan Knevels, Bree, BE;
Gerrit Broekmans, Paal, BE;
Inventors:
Francis Dams, Kessel-Lo, BE;
Lihuan Song, Lommel, BE;
Johan Knevels, Bree, BE;
Gerrit Broekmans, Paal, BE;
Assignee:
Heraeus Electro-Nite International N.V., Houthalen, BE;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/20 (2006.01); G01N 1/12 (2006.01); C21C 5/46 (2006.01); F27D 21/00 (2006.01); F27D 19/00 (2006.01); C21C 5/52 (2006.01);
U.S. Cl.
CPC ...
G01N 33/206 (2013.01); F27D 2019/0006 (2013.01); C21C 5/4673 (2013.01); G01N 1/125 (2013.01); F27D 19/00 (2013.01); F27D 21/00 (2013.01); C21C 2005/5288 (2013.01);
Abstract
A method is provided for analyzing samples of metal melts, wherein a sample is taken from a metal melt using a sampler having a sample chamber and which is constructed as an immersion lance. The method includes transporting the sample from the sampler through a transport conduit to the sphere of action of an analytical device, and analyzing the sample there using the analytical device.