The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Jun. 01, 2011
Kazuki Takashima, Kumamoto, JP;
Masaaki Otsu, Kumamoto, JP;
Mitsuhiro Matsuda, Kumamoto, JP;
Hiroaki Kurahara, Kumamoto, JP;
Hidetaka Maeda, Hidaka, JP;
Tadahiro Yonekura, Hidaka, JP;
Kazuki Takashima, Kumamoto, JP;
Masaaki Otsu, Kumamoto, JP;
Mitsuhiro Matsuda, Kumamoto, JP;
Hiroaki Kurahara, Kumamoto, JP;
Hidetaka Maeda, Hidaka, JP;
Tadahiro Yonekura, Hidaka, JP;
Kumamoto University, Kumamoto-shi, Kumamoto, JP;
Abstract
A measurement unit for tensile or compressive stress can includes a CCD camera for detecting an interference light, the interference light being formed with a measurement beam from a measured region and a reference beam from a reference mirror. A first objective lens can have the reference mirror. An image processing apparatus can measure the three-dimensional shape of the measured region from the position of the first objective lens at which the interference light provides the maximum contrast and can measure the distance between two gauge points on the basis of the three-dimensional shape. When strain is generated on a micromaterial, the strain against the measured tensile stress is measured on the basis of the tensile stress and the distance between the two gauge points.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile