The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Jun. 16, 2010
Applicants:

Randal P. Treit, Monroe, WA (US);

Joseph J. Johnson, Seattle, WA (US);

Adrian Marinescu, Sammamish, WA (US);

Nitin Sood, Redmond, WA (US);

Marc E. Seinfeld, Fort Lauderdale, FL (US);

Inventors:

Randal P. Treit, Monroe, WA (US);

Joseph J. Johnson, Seattle, WA (US);

Adrian Marinescu, Sammamish, WA (US);

Nitin Sood, Redmond, WA (US);

Marc E. Seinfeld, Fort Lauderdale, FL (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01);
Abstract

In some embodiments, a local agent on a target system may evaluate current and/or historical system state information from a store (either local or remote) and dynamically adjust the level of diagnosis performed during the scan based on the evaluated state information. Individual diagnostic scans may, for example, be enabled and disabled based on the context in the store, and each scan may update the context for further evaluation. By employing such an approach, systems with a low risk profile and lacking symptoms of a problem may be scanned quickly while systems that show signs of a problem or have a high risk profile may receive a more thorough evaluation.


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