The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Apr. 22, 2008
Applicant:

Hiroshi Sakaki, Tokyo, JP;

Inventor:

Hiroshi Sakaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/10 (2013.01);
Abstract

A risk value is calculated to suit a state and environment of an analysis target system, by presenting data for determining whether or not a calculated risk is correct, and presenting portions for parameters to be changed such as weights related to a threat, a vulnerability and a measure contained in the risk model. A risk model correcting system includes a risk model storage section that stores as a risk model, a correspondence relationship between threats constituting a risk and a measure for each threat, and parameters including weights of them; an information collecting section that collects data of an analysis target system; an influence degree calculating section that calculates an influence degree of the existence or non-existence of the measure on a result of the calculation of the risk value; a risk analyzing section that performs a risk analysis on the analysis target system; and a reason presenting section that present a reason of the risk calculation by presenting the influence degree calculated by the risk degree calculating section.


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