The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Aug. 31, 2011
Applicants:
Yohan J. Roh, Yongin-si, KR;
Myoung Ho Kim, Daejeon-si, KR;
Jaeho Kim, Daejeon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30592 (2013.01); G06F 17/30469 (2013.01);
Abstract
An apparatus and method for calculating the selectivity of a range query for multidimensional data using a multidimensional histogram are provided. A data space may be partitioned into one or more sub-spaces based on a sum of skew values of the one or more sub-spaces, a space-partitioning tree may be generated for the data space, and a multidimensional histogram may be generated for the data space based on the space-partitioning tree. A range query for multidimensional data may be processed based on the multidimensional histogram.