The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Sep. 13, 2012
Applicants:

Jing-yun Shyr, Naperville, IL (US);

Damir Spisic, Chicago, IL (US);

Raymond Wright, Evanston, IL (US);

Jing Xu, Xian, CN;

Xueying Zhang, Xi'an, CN;

Inventors:

Jing-Yun Shyr, Naperville, IL (US);

Damir Spisic, Chicago, IL (US);

Raymond Wright, Evanston, IL (US);

Jing Xu, Xian, CN;

Xueying Zhang, Xi'an, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30321 (2013.01);
Abstract

Provided are techniques for analyzing fields. Statistical metrics for each field in a data set are received. A general interestingness index is generated for each field using one or more combination functions that aggregate standardized interestingness sub-indexes. One or more fields are identified as interesting for further analysis using the general interestingness index. One or more expert recommendations for field transformations are constructed for the identified one or more fields.


Find Patent Forward Citations

Loading…