The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8843487 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 23, 2014

Filed:

Aug. 18, 2010
Applicants:

Thomas Rickett Mcgraw, Little Rock, AR (US);

Larry Ward Burks, Little Rock, AR (US);

Brian Kolo, Leesburg, VA (US);

Inventors:

Thomas Rickett McGraw, Little Rock, AR (US);

Larry Ward Burks, Little Rock, AR (US);

Brian Kolo, Leesburg, VA (US);

Assignee:

Black Oak Partners, LLC, Little Rock, AR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates generally to methods, software and systems for measuring and valuing the quality of information and data, where such measurements and values are made and processed by implementing objectively defined, measurable, comparable and repeatable dimensions using software and complex computers. The embodiments include processes, systems and method for identifying optimal scores of the data dimension. The invention further includes processes, systems and method for data filtering to improve the overall data quality of a data source. Finally, the invention further includes processes, systems and method for data quality assurance of groups of rows of a database.


Find Patent Forward Citations

McGraw, Thomas. (2014). Process and method for data assurance management by applying data assurance metrics (U.S. Patent No. 8843487). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8843487

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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