The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Mar. 31, 2010
Chengwei Wang, Atlanta, GA (US);
Vanish Talwar, Campbell, CA (US);
Partha Ranganathan, San Jose, CA (US);
Chengwei Wang, Atlanta, GA (US);
Vanish Talwar, Campbell, CA (US);
Partha Ranganathan, San Jose, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Illustrated is a system and method for anomaly detection in data centers and across utility clouds using an Entropy-based Anomaly Testing (EbAT), the system and method including normalizing sample data through transforming the sample data into a normalized value that is based, in part, on an identified average value for the sample data. Further, the system and method includes binning the normalized value through transforming the normalized value into a binned value that is based, in part, on a predefined value range for a bin such that a bin value, within the predefined value range, exists for the sample data. Additionally, the system and method includes identifying at least one vector value from the binned value. The system and method also includes generating an entropy time series through transforming the at least one vector value into an entropy value to be displayed as part of a look-back window.