The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Aug. 19, 2011
Ty Matthew Thomson, Arlington, MA (US);
Dexter Roydon Pratt, Reading, MA (US);
Ty Matthew Thomson, Arlington, MA (US);
Dexter Roydon Pratt, Reading, MA (US);
Selventa, Inc., Cambridge, MA (US);
Abstract
A 'Specificity' statistic (or metric) is computed as a means to identify amplitude scores associated with a signature that can be attributed with high probability to a specific biological entity or process represented by the signature. Preferably, Specificity is computed by assessing a likelihood of a given null hypothesis, namely, that an amplitude score is not representative of the specific signature but, instead, is representative of a general trend in the applicable data set that can be measured by any signature that is comparable to the signature of interest. In a typical implementation, a first step to compute the Specificity metric is to construct a set of comparable signatures. Next, an amplitude score is computed for each of these signatures, preferably using the same data set. Then, the Specificity metric is computed, preferably as a two-tailed p-value, by placing the amplitude score for the signature of interest on a distribution of scores for the comparable signatures. Scores that have Specificity p-values less than a particular value, e.g., 0.05, are considered to be scores that can be attributed with high confidence to the signature of interest.