The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Sep. 27, 2010
Peter J. Pupalaikis, Ramsey, NJ (US);
Anirudh Sureka, Mamaroneck, NY (US);
Kaviyesh Doshi, Pearl River, NY (US);
Peter J. Pupalaikis, Ramsey, NJ (US);
Anirudh Sureka, Mamaroneck, NY (US);
Kaviyesh Doshi, Pearl River, NY (US);
Teledyne LeCroy, Inc., Thousand Oaks, CA (US);
Abstract
A method and apparatus are provided for the removal of significant broad-band noise from waveforms acquired for time domain network analysis. The method may include the steps of providing the noisy waveform as an input waveform, determining a frequency domain noise shape associated with the input waveform, calculating a wavelet domain noise shape from the frequency domain noise shape, calculating a discrete wavelet transform of the input waveform to form a wavelet domain waveform, and estimating the noise statistics from the wavelet domain waveform. A threshold may be calculated from the estimated noise statistics and the wavelet domain noise shape, and the threshold may be applied to the wavelet domain waveform to form a denoised wavelet domain waveform. Finally, an inverse discrete wavelet transform of the denoised wavelet domain waveform may be calculated to form a denoised waveform.