The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Nov. 26, 2010
Applicants:

David Wang, Northville, MI (US);

Daisy Red, Royal Oak, MI (US);

Ivan Nausley, Dearborn, MI (US);

Inventors:

David Wang, Northville, MI (US);

Daisy Red, Royal Oak, MI (US);

Ivan Nausley, Dearborn, MI (US);

Assignee:

Comau SpA, Turin, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 9/02 (2006.01); G06F 11/30 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0232 (2013.01);
Abstract

A method for monitoring performance of at least one task in controlled equipment is disclosed herein. The method includes collecting a series of signals associated with the at least one task, at least some of the signals in the series define timing values for the at least one task. comparing each of at least some of the timing values to a reference value, generating an accumulated variance value based on the comparisons and selectively generating a predictive failure indication based on the generated accumulated variance value.


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