The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Dec. 02, 2010
Hiroki Uematsu, Suntou-gun, JP;
Harunobu Ogaki, Suntou-gun, JP;
Atsushi Ochi, Hino, JP;
Yasuhiro Kawai, Susono, JP;
Koji Takahashi, Suntou-gun, JP;
Shio Murai, Numazu, JP;
Hiroki Uematsu, Suntou-gun, JP;
Harunobu Ogaki, Suntou-gun, JP;
Atsushi Ochi, Hino, JP;
Yasuhiro Kawai, Susono, JP;
Koji Takahashi, Suntou-gun, JP;
Shio Murai, Numazu, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An electrophotographic photosensitive member having excellent cleaning performance, a process cartridge, and an electrophotographic apparatus. The peripheral surface of the member has flat portions having a width e (μm) satisfying 0.1≦e≦25 and a plurality of groove portions having a width w (μm) satisfying 0.1≦w≦25 and a depth d (μm) satisfying 0.1≦d≦3.0, the flat and groove portions at an angle θ (°) satisfying 80≦θ≦100 with respect to the axial direction of the member. The sum e(μm) of the widths e of the flat portions per each width ofμm in the axial direction of the peripheral surface satisfying 5≦e≦75, and e/esatisfying e/e≦0.46, where e(μm) is the average value of the widths e of the flat portions, and eis the standard deviation thereof.