The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Jul. 07, 2009
Sanjiv Singh Samant, Gainesville, FL (US);
Arun Gopal, Gainesville, FL (US);
Sanjiv Singh Samant, Gainesville, FL (US);
Arun Gopal, Gainesville, FL (US);
University of Florida Research Foundation, Inc., Gainesville, FL (US);
Abstract
Embodiments of the invention relate to a method for x-ray radiography and apparatus for use in x-ray radiography. Specific embodiments can utilize a grid having a plurality of apertures therethrough with optical waveguides positioned in the apertures. The optical waveguides can incorporate a scintillating material, preferably throughout, that absorbs incident x-ray radiation and emits light that is then guided by the optical waveguide. In a specific embodiment, x-ray radiation incident on a first end of the aperture is absorbed by the scintillating material in the optical waveguide and light is emitted by the same scintillating material, a portion of which is guided by the optical waveguide to a second end of the aperture. In addition, secondary electrons created by absorption of the x-ray radiation by the scintillating material can be absorbed by the scintillating material to create more light such that a magnification effect can occur. The light exiting the second end of the aperture can then be detected.