The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Dec. 17, 2012
Litepoint Corporation, Sunnyvale, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Wing Hung Lee, Saratoga, CA (US);
Guang Shi, San Jose, CA (US);
Sang Yui Hon, Cupertino, CA (US);
Litepoint Corporation, Sunnyvale, CA (US);
Abstract
Method and system for facilitating testing of multiple time-division-duplex (TDD) data packet signal transceivers. Replicas of a data packet signal are transmitted by a tester to multiple TDD devices under test (DUTs), where the replicated signal is either a null or TDD data packet signal. In one embodiment, replica null data packet signals are transmitted for a predetermined time interval sufficient for the DUTs to synchronize with the tester. In another embodiment, following successful and unsuccessful receptions of responsive signals from respective DUTs indicating successful reception of their respective replica TDD data packet signals and, therefore, synchronization with the tester, corresponding replica TDD data packet signals are provided with data packet signal characteristics causing such replica data packet signals to fail to conform or to conform, respectively, with a predetermined data packet signal standard. Following synchronization, test and responsive data packet signals can be exchanged between the tester and DUTs.