The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Nov. 11, 2010
Applicants:
Martin Heine, Seuzach, CH;
Stefan Manz, Constance, DE;
Inventors:
Martin Heine, Seuzach, CH;
Stefan Manz, Constance, DE;
Assignee:
Bühler AG, Uzwil, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 1/08 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/08 (2013.01); G01N 2015/1472 (2013.01); G01N 2015/0092 (2013.01); G01N 15/1475 (2013.01); G01N 15/147 (2013.01); G01N 2015/0019 (2013.01);
Abstract
A method for measuring particle size distributions of bulk materials such as cereals, cereal milling products, cereal products and the like, which is intended to enable the measurement of particle size distributions which vary by orders of magnitude. A sample of isolated particles is optically detected in an arrangement by at least two measurement methods. Preferably, detection of the contours of the particles and laser diffraction take place at the same time.