The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Oct. 14, 2008
Applicants:

Simon Chen, San Jose, CA (US);

Jen-chan Chien, Saratoga, CA (US);

Hailin Jin, San Jose, CA (US);

Inventors:

Simon Chen, San Jose, CA (US);

Jen-Chan Chien, Saratoga, CA (US);

Hailin Jin, San Jose, CA (US);

Assignee:

Adobe Systems Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for determining sensor format factors from image metadata in which one of multiple techniques is applied to determine a sensor format factor for a camera from information in the metadata. Information from the metadata may be used to identify which of the multiple techniques to use. For example, the camera make and model may be used to determine a particular technique to use. As another example, the presence or absence of particular attributes or values for particular attributes may be used in determining a particular technique. In one embodiment, a profile database may be searched according to information in the metadata to determine if a sensor format factor for the camera is in the database. If the sensor format factor for the camera is not in the database, other information in the metadata may be examined to determine a particular technique from among the plurality of techniques.


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