The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Feb. 19, 2010
Takashi Saeki, Hitachi, JP;
Masaya Itoh, Hitachinaka, JP;
Masato Kazui, Hitachi, JP;
Masanori Miyoshi, Mito, JP;
Hisao Oodawa, Hitachinaka, JP;
Kouichi Shiraishi, Tokai, JP;
Takao Sukegawa, Yokohama, JP;
Takashi Saeki, Hitachi, JP;
Masaya Itoh, Hitachinaka, JP;
Masato Kazui, Hitachi, JP;
Masanori Miyoshi, Mito, JP;
Hisao Oodawa, Hitachinaka, JP;
Kouichi Shiraishi, Tokai, JP;
Takao Sukegawa, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The object of the invention is to provide a supervising system for image to detect a scheme at high accuracy. The supervising system for image is provided with a first portion for detecting change of time detecting the change of time in amount of feature of an image taken pictures by a image forming device, a second portion for detecting change of time in the illuminance detected by an illuminance sensor, and a scheme judging portion detecting a scheme against the image forming device in accordance with the change of time in amount of feature and the change of time in the illuminance as detected.