The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Sep. 06, 2012
Applicants:

Chinsong Sul, Santa Clara, CA (US);

Hyukyong Kwon, Dublin, CA (US);

Andy NG, Hayward, CA (US);

Inventors:

Chinsong Sul, Santa Clara, CA (US);

Hyukyong Kwon, Dublin, CA (US);

Andy Ng, Hayward, CA (US);

Assignee:

Silicon Image, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/03 (2006.01);
U.S. Cl.
CPC ...
H03K 3/0315 (2013.01);
Abstract

A method and apparatus is disclosed herein for testing of multiple ring oscillators. In one embodiment, the apparatus comprises at least one ring oscillator structure having a ring oscillator having an inverter chain with an odd number of inverters connected back-to-back and operable to produce an oscillatory output, and a test structure coupled to provide either an observability chain input or a test input to the ring oscillator and to receive the oscillatory output as a feedback from the ring oscillator.


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