The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Jul. 30, 2010
Gregory Douglas Vanwiggeren, San Jose, CA (US);
Gregory Douglas Vanwiggeren, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A system for measuring a property of a device under test (DUT) includes a stimulus signal generator and a receiver. The stimulus signal generator generates a repetitive stimulus signal under control of a first clock, and provides the stimulus signal to an input port of the DUT. The receiver receives an input signal output from the DUT, the input signal being based on the stimulus signal provided to the input port of the DUT. The receiver includes a second clock syntonized with the first clock, a memory that stores a calibration measurement of a calibration stimulus signal provided to the receiver during a calibration period without the DUT being connected to the stimulus signal generator, and a data processor configured to determine the property of the DUT by comparing the stored calibration measurement with a measurement of the input signal from the DUT performed under control of the second clock.