The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Jul. 13, 2012
Applicants:

Heinrich Lysen, Garching, DE;

Werner Bräu, Ismaning, DE;

Inventors:

Heinrich Lysen, Garching, DE;

Werner Bräu, Ismaning, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9046 (2013.01);
Abstract

A test set-up () for non-destructive detection of a flaw in a device being tested by means of an eddy current has an excitation coil (), to which an excitation signal (SE) can be sent to act on the device being tested () with an electromagnetic alternating field, a receiving coil () to generate a coil signal (SP), which is a function of the flaw in the device being tested (), an analog-digital converter (), which is coupled to the receiving coil () on the input side, a filter arrangement (), which is coupled to the analog-digital converter () on the input side and is designed for band-pass filtering and scan rate reduction, and a demodulator (), which is coupled to an output of the filter arrangement () on the input side.


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