The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

Jun. 13, 2012
Applicants:

Yukio Tsuzuki, Nukata-gun, JP;

Hiromitsu Tanabe, Nukata-gun, JP;

Kenji Kouno, Gifu, JP;

Inventors:

Yukio Tsuzuki, Nukata-gun, JP;

Hiromitsu Tanabe, Nukata-gun, JP;

Kenji Kouno, Gifu, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 29/10 (2006.01); H01L 29/66 (2006.01); H01L 29/739 (2006.01); H01L 29/861 (2006.01); H01L 29/32 (2006.01); H01L 21/263 (2006.01);
U.S. Cl.
CPC ...
H01L 21/263 (2013.01); H01L 29/7397 (2013.01); H01L 29/861 (2013.01); H01L 29/32 (2013.01); H01L 29/1095 (2013.01);
Abstract

A semiconductor device includes an IGBT forming region and a diode forming region. The IGBT forming region includes an IGBT operating section that operates as an IGBT and a thinned-out section that does not operate as an IGBT. The IGBT operating section includes a channel region, and the thinned-out section includes a first anode region. The diode forming region includes a second anode region. When an area density is defined as a value calculated by integrating a concentration profile of second conductivity type impurities in each of the channel region, the first anode region, and the second anode region in a depth direction, an area density of the channel region is higher than an area density of the first anode region and an area density of the second anode region.


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