The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2014
Filed:
Feb. 21, 2012
Daisaku Horikawa, Saitama, JP;
Mamoru Yorimoto, Kanagawa, JP;
Tatsuhiko Okada, Saitama, JP;
Makoto Moriwaki, Kanagawa, JP;
Daisaku Horikawa, Saitama, JP;
Mamoru Yorimoto, Kanagawa, JP;
Tatsuhiko Okada, Saitama, JP;
Makoto Moriwaki, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image forming apparatus is disclosed which reads a test pattern, including a reading unit, a relative movement unit, a second detected data obtaining unit which obtains one or more second detected data sets of a reflected light which is received from a scanning position of a light by a light receiving unit while the reading unit moves relatively with respect to the recording medium before the test pattern is formed, a first detected data obtaining unit which obtains one or more first detected data sets of the reflected light which is received by the light receiving unit when the light moves over the test pattern at generally the same scanning position as the scanning position while the reading unit moves relatively with respect to the recording medium after the test pattern is formed, and a signal correction unit.