The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

May. 07, 2012
Applicants:

Gustavo DE Los Reyes, Fair Haven, NJ (US);

Sanjay Macwan, Marlboro, NJ (US);

Jennifer Morovitz, Ballwin, MO (US);

Inventors:

Gustavo de los Reyes, Fair Haven, NJ (US);

Sanjay Macwan, Marlboro, NJ (US);

Jennifer Morovitz, Ballwin, MO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04H 60/56 (2008.01); H04N 21/4425 (2011.01); H04N 21/488 (2011.01); H04N 21/443 (2011.01);
U.S. Cl.
CPC ...
H04N 21/443 (2013.01); H04N 21/4425 (2013.01); H04N 21/488 (2013.01);
Abstract

A method for problem detection related to received data includes monitoring data to detect a first problem and a second problem related to the data. The first problem may be related to a first data type and the second problem may be related to a second data type. The first data type and the second data type may be distinct from each other. The method includes determining a first remedial action in response to detecting the first problem and a second remedial action in response to detecting the second problem. The method includes determining a priority order for the first remedial action and the second remedial action.


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