The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Oct. 12, 2012
Applicant:
Vmware,inc., Palo Alto, CA (US);
Inventors:
Callistus C Schissel, Brooklyn Park, MN (US);
Sean McDonald, St. Paul, MN (US);
David Gibbens, Blaine, MN (US);
Assignee:
VMware, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of testing a software item, an automated test of a software item is conducted. In response to occurrence of an error condition during the test, test data associated with the error condition is captured. A portion of the captured test data is forwarded to a designated electronic notification location.
Schissel, Callistus. (2014). Capturing test data associated with error conditions in software item testing (U.S. Patent No. 8839201). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8839201
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile