The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Sep. 14, 2011
Slavik Dimitrovich, Woodinville, WA (US);
Venkata Uday Kumar Kalepalli Naga, Andhra Pradesh, IN;
Siamak Irantash, Bothell, WA (US);
Michael L Collado, Kent, WA (US);
Vijay P Singh, Seattle, WA (US);
Michael C. Moore, Issaquah, WA (US);
Slavik Dimitrovich, Woodinville, WA (US);
Venkata Uday Kumar Kalepalli Naga, Andhra Pradesh, IN;
Siamak Irantash, Bothell, WA (US);
Michael L Collado, Kent, WA (US);
Vijay P Singh, Seattle, WA (US);
Michael C. Moore, Issaquah, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
In some implementations, a testing service receives a test execution request for executing test operations on a test target. The testing service may map the test execution request to a particular type of supported test framework from among a plurality of types of supported test frameworks. The testing service may obtain a test package provided by a user that requested the testing, such as from a cloud storage location. The testing service determines a computing capacity for executing the testing and appropriates a plurality of workers in a cloud computing service. The testing service configures the plurality of workers for executing the test operations based on at least one of the test framework, the test execution request or the test package. The testing service provides test execution chunks from the test package to the plurality of workers for executing the testing on the test target.