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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8838607 B1

PDFFull Text
Expired
Date of Patent:
Sep. 16, 2014

Filed:

Oct. 17, 2012

Software system test case creation

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Futoshi Iwama, Yokohama, JP;

Ken Mizuno, Tokyo, JP;

Taiga Nakamura, Takatsu Kawasaki, JP;

Hironori Takeuchi, Yokohama, JP;

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorneys:

Cantor Colburn LLP

Vazken Alexanian

Primary Examiner:

Baoquoc N To

Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test case generation system includes a processor, a process residing on the processor and configured to extract descriptions from document artifacts, extract a first set of keywords from the descriptions, categorize the descriptions to a first set and a second set, extract a second set of keywords that occur in the second set and generate a test case from the second set of keywords.

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Iwama, Futoshi. (2014). Software system test case creation (U.S. Patent No. 8838607). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8838607

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