The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Nov. 20, 2009
Applicants:

Masamoto Tanabiki, Kanagawa, JP;

Takashi Shimojima, Saitama, JP;

Makoto Yasugi, Tokyo, JP;

Inventors:

Masamoto Tanabiki, Kanagawa, JP;

Takashi Shimojima, Saitama, JP;

Makoto Yasugi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 5/00 (2006.01); G01S 5/04 (2006.01); G01S 7/40 (2006.01); G01S 5/02 (2010.01); G01S 13/82 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
G01S 13/82 (2013.01); G01S 7/4004 (2013.01); G01S 5/0226 (2013.01); G06K 7/00 (2013.01);
Abstract

An installation error estimating device has a predicted pattern acquirer which obtains a predicted positioning distribution pattern, which is obtained by computing a characteristic pattern of a predicted positioning distribution obtained by predicting a logical positioning distribution, at each observation point where a wireless tag is installed for positioning; and an observation data inputter to which positioning results obtained from the wireless tags by a tag reader are input as observation data. A dispersion pattern analyzer computes a characteristic pattern of a measured positioning distribution, which is obtained by statistical analysis of the applicable positioning result, as a measured positioning distribution pattern at each observation point based on the observation. An installation error estimator computes the installation error for the tag reader using the predicted positioning distribution patterns obtained and the measured positioning distribution patterns computed.


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