The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Mar. 21, 2011
Applicants:

Manuel Del Castillo, Madrid, ES;

Steve Malkos, San Jose, CA (US);

Inventors:

Manuel del Castillo, Madrid, ES;

Steve Malkos, San Jose, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01);
U.S. Cl.
CPC ...
G01C 17/38 (2013.01);
Abstract

A multi-magnetometer device comprises at least two z-axis aligned and physically rotated magnetometer triads utilized for measuring corresponding earth's magnetic field. The magnetic field measurements are utilized to measure rotation measurements of a single orthogonal axis along the 360 degrees of the complete circle without user's assistance and/or magnetometer movement for magnetometer calibration. The multi-magnetometer device may compute its magnetic heading utilizing the magnetic field measurements if no magnetic perturbations are detected. When magnetic perturbations are detected, a perturbation mitigation process may be performed. The rotation measurements may be generated by selectively combining the magnetic field measurements. Hard-iron components are determined utilizing the rotation measurements, and are removed from the magnetic field measurements. Soft-iron components are determined utilizing the hard-iron free magnetic field measurements, and are removed from the hard-iron free magnetic field measurements. The resulting perturbation free magnetic field measurements are utilized to compute magnetic heading.


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