The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Jan. 28, 2010
Hideaki Suzuki, Hitachi, JP;
Yoshinori Furuno, Tsuchiura, JP;
Kozo Nakamura, Hitachiota, JP;
Shinya Yuda, Hitachi, JP;
Hiroki Uchiyama, Kawasaki, JP;
Hideaki Suzuki, Hitachi, JP;
Yoshinori Furuno, Tsuchiura, JP;
Kozo Nakamura, Hitachiota, JP;
Shinya Yuda, Hitachi, JP;
Hiroki Uchiyama, Kawasaki, JP;
Hitachi Construction Machinery Co., Ltd., Tokyo, JP;
Abstract
Monitoring and diagnosing device including: a classification information storage section; frequency information storage section: a first data classifier section reading out reference classification information from the classification information storage section, comparing operational data, detected by a plurality of sensors and inputted in time sequence, with the reference classification information to classify the operational data, and then generating operational data classification information; a frequency comparator section compiling the operational data classification information, generating operational data frequency information by adding, to the operational data classification information, appearance frequency information for each classification of operational data, reading out reference frequency information from the frequency information storage section, and then generating operational data frequency comparison information by comparing operational data frequency information with the reference frequency information; and an abnormality diagnosing section performing an abnormality diagnosis upon the working machine by use of the operational data classification information and operational data frequency comparison information.